Resultats de la cerca - Stover

Repeat Performances per Stover

Full text available on Project MUSE [7/18/16]

Optical Scattering: Measurement and Analysis, 3rd Ed per Stover, John C.

Full text available on Research4Life (SPIE Digital Library)

Optical Scattering: Measurement and Analysis, 2nd Ed per Stover, John C.

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Scatter from Optical Components

Altres autors: “…Stover, John…”
Full text available on Research4Life (SPIE Digital Library)

Optical Scatter: Applications, Measurement, and Theory

Altres autors: “…Stover, John…”
Full text available on Research4Life (SPIE Digital Library)

Optical Scattering: Applications, Measurement, and Theory II

Altres autors: “…Stover, John…”
Full text available on Research4Life (SPIE Digital Library)

Optical Scattering in the Optics, Semiconductor, and Computer Disk Industries

Altres autors: “…Stover, John…”
Full text available on Research4Life (SPIE Digital Library)

Optical Microlithography I: Technology for the Mid-1980s

Altres autors: “…Stover, Harry…”
Full text available on Research4Life (SPIE Digital Library)

Optical Microlithography II: Technology for the 1980s

Altres autors: “…Stover, Harry…”
Full text available on Research4Life (SPIE Digital Library)

Optical Microlithography III: Technology for the Next Decade

Altres autors: “…Stover, Harry…”
Full text available on Research4Life (SPIE Digital Library)

Optical Microlithography IV

Altres autors: “…Stover, Harry…”
Full text available on Research4Life (SPIE Digital Library)

Optical Microlithography V

Altres autors: “…Stover, Harry…”
Full text available on Research4Life (SPIE Digital Library)

Optical Microlithography VI

Altres autors: “…Stover, Harry…”
Full text available on Research4Life (SPIE Digital Library)

Optical Microlithographic Technology for Integrated Circuit Fabrication and Inspection

Altres autors: “…Stover, Harry…”
Full text available on Research4Life (SPIE Digital Library)

Flatness, Roughness, and Discrete Defect Characterization for Computer Disks, Wafers, and Flat Panel Displays

Altres autors: “…Stover, John…”
Full text available on Research4Life (SPIE Digital Library)

Flatness, Roughness, and Discrete Defects Characterization for Computer Disks, Wafers, and Flat Panel Displays II

Altres autors: “…Stover, John…”
Full text available on Research4Life (SPIE Digital Library)

Surface Characterization for Computer Disks, Wafers, and Flat Panel Displays

Altres autors: “…Stover, John…”
Full text available on Research4Life (SPIE Digital Library)