Proceedings of the 1995 ACM SIGMETRICS joint international conference on Measurement and modeling of computer systems

Détails bibliographiques
Autres auteurs: Gaither
Format: Électronique eBook
Langue:anglais
Publié: Association for Computing Machinery (ACM), 5/1/95
Sujets:
Accès en ligne:Full text available on Research4Life (ACM)
Description
Description:<strong>On-Campus Access Only (IP based access)</strong>
Description matérielle:1 online resource
Format:Mode of access: Internet
ISBN:9780897916950
Accès:Electronic access restricted to authorized AUW faculty, staff and students