Proceedings of the 2000 ACM SIGMETRICS international conference on Measurement and modeling of computer systems

Detalles Bibliográficos
Formato: Electrónico eBook
Idioma:inglés
Publicado: Association for Computing Machinery (ACM), 6/17/00
Subjects:
Acceso en liña:Full text available on Research4Life (ACM)
Descripción
descrición da copia:<strong>On-Campus Access Only (IP based access)</strong>
Descrición Física:1 online resource
Formato:Mode of access: Internet
ISBN:9781581131949
Acceso:Electronic access restricted to authorized AUW faculty, staff and students