Proceedings of the 2nd international workshop on Random testing: co-located with the 22nd IEEE/ACM International Conference on Automated Software Engineering (ASE 2007)

Détails bibliographiques
Format: Électronique eBook
Langue:anglais
Publié: Association for Computing Machinery (ACM), 11/6/07
Sujets:
Accès en ligne:Full text available on Research4Life (ACM)

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