Proceedings of the 2nd International Workshop on Defects in Large Software Systems: Held in conjunction with the ACM SIGSOFT International Symposium on Software Testing and Analysis (ISSTA 2009)

Bibliographische Detailangaben
Weitere Verfasser: Liblit
Format: Elektronisch E-Book
Sprache:Englisch
Veröffentlicht: Association for Computing Machinery (ACM), 6/19/09
Schlagworte:
Online-Zugang:Full text available on Research4Life (ACM)
Beschreibung
Beschreibung:<strong>On-Campus Access Only (IP based access)</strong>
Beschreibung:1 online resource
Format:Mode of access: Internet
ISBN:9781605586540
Zugangseinschränkungen:Electronic access restricted to authorized AUW faculty, staff and students