Proceedings of the 2nd International Workshop on Defects in Large Software Systems: Held in conjunction with the ACM SIGSOFT International Symposium on Software Testing and Analysis (ISSTA 2009)

Detalles Bibliográficos
Otros Autores: Liblit
Formato: Electrónico eBook
Lenguaje:inglés
Publicado: Association for Computing Machinery (ACM), 6/19/09
Materias:
Acceso en línea:Full text available on Research4Life (ACM)
Descripción
Notas:<strong>On-Campus Access Only (IP based access)</strong>
Descripción Física:1 online resource
Formato:Mode of access: Internet
ISBN:9781605586540
Acceso:Electronic access restricted to authorized AUW faculty, staff and students