Proceedings of the 2nd International Workshop on Defects in Large Software Systems: Held in conjunction with the ACM SIGSOFT International Symposium on Software Testing and Analysis (ISSTA 2009)

Xehetasun bibliografikoak
Beste egile batzuk: Liblit
Formatua: Baliabide elektronikoa eBook
Hizkuntza:ingelesa
Argitaratua: Association for Computing Machinery (ACM), 6/19/09
Gaiak:
Sarrera elektronikoa:Full text available on Research4Life (ACM)
Deskribapena
Alearen deskribapena:<strong>On-Campus Access Only (IP based access)</strong>
Deskribapen fisikoa:1 online resource
Formatua:Mode of access: Internet
ISBN:9781605586540
Sartu:Electronic access restricted to authorized AUW faculty, staff and students