Proceedings of the 2nd International Workshop on Defects in Large Software Systems: Held in conjunction with the ACM SIGSOFT International Symposium on Software Testing and Analysis (ISSTA 2009)

Détails bibliographiques
Autres auteurs: Liblit
Format: Électronique eBook
Langue:anglais
Publié: Association for Computing Machinery (ACM), 6/19/09
Sujets:
Accès en ligne:Full text available on Research4Life (ACM)
Description
Description:<strong>On-Campus Access Only (IP based access)</strong>
Description matérielle:1 online resource
Format:Mode of access: Internet
ISBN:9781605586540
Accès:Electronic access restricted to authorized AUW faculty, staff and students