Proceedings of the 2nd International Workshop on Defects in Large Software Systems: Held in conjunction with the ACM SIGSOFT International Symposium on Software Testing and Analysis (ISSTA 2009)

Bibliografische gegevens
Andere auteurs: Liblit
Formaat: Elektronisch E-boek
Taal:Engels
Gepubliceerd in: Association for Computing Machinery (ACM), 6/19/09
Onderwerpen:
Online toegang:Full text available on Research4Life (ACM)
Omschrijving
Beschrijving item:<strong>On-Campus Access Only (IP based access)</strong>
Fysieke beschrijving:1 online resource
Formaat:Mode of access: Internet
ISBN:9781605586540
Toegang:Electronic access restricted to authorized AUW faculty, staff and students