Proceedings of the 2nd International Workshop on Defects in Large Software Systems: Held in conjunction with the ACM SIGSOFT International Symposium on Software Testing and Analysis (ISSTA 2009)
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| Materyal Türü: | Elektronik Ekitap |
| Dil: | İngilizce |
| Baskı/Yayın Bilgisi: |
Association for Computing Machinery (ACM),
6/19/09
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| Konular: | |
| Online Erişim: | Full text available on Research4Life (ACM) |
| Diğer Bilgileri: | <strong>On-Campus Access Only (IP based access)</strong> |
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| Fiziksel Özellikler: | 1 online resource |
| Materyal Türü: | Mode of access: Internet |
| ISBN: | 9781605586540 |
| Erişim: | Electronic access restricted to authorized AUW faculty, staff and students |