Proceedings of the 2nd International Workshop on Defects in Large Software Systems: Held in conjunction with the ACM SIGSOFT International Symposium on Software Testing and Analysis (ISSTA 2009)
| Autres auteurs: | |
|---|---|
| Format: | Électronique eBook |
| Langue: | anglais |
| Publié: |
Association for Computing Machinery (ACM),
6/19/09
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| Sujets: | |
| Accès en ligne: | Full text available on Research4Life (ACM) |
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