Proceedings of the 2nd International Workshop on Defects in Large Software Systems: Held in conjunction with the ACM SIGSOFT International Symposium on Software Testing and Analysis (ISSTA 2009)

Dettagli Bibliografici
Altri autori: Liblit
Natura: Elettronico eBook
Lingua:inglese
Pubblicazione: Association for Computing Machinery (ACM), 6/19/09
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Accesso online:Full text available on Research4Life (ACM)

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