Proceedings of the 2nd International Workshop on Defects in Large Software Systems: Held in conjunction with the ACM SIGSOFT International Symposium on Software Testing and Analysis (ISSTA 2009)
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| Materyal Türü: | Elektronik Ekitap |
| Dil: | İngilizce |
| Baskı/Yayın Bilgisi: |
Association for Computing Machinery (ACM),
6/19/09
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| Konular: | |
| Online Erişim: | Full text available on Research4Life (ACM) |