Electron-Beam, X-Ray, and Ion-Beam Submicrometer Lithographies for Manufacturing II

Bibliografske podrobnosti
Drugi avtorji: Peckerar, Martin
Format: Elektronski eKnjiga
Jezik:angleščina
Izdano: SPIE Digital Library, 7/9/92
Teme:
Online dostop:Full text available on Research4Life (SPIE Digital Library)
Opis
Opis knjige/članka:<strong>On-Campus Access Only (IP based access)</strong>
Fizični opis:1 online resource
Format:Mode of access: Internet
ISBN:9780819408266
Dostop:Electronic access restricted to authorized AUW faculty, staff and students