Electron-Beam, X-Ray, and Ion-Beam Submicrometer Lithographies for Manufacturing II

书目详细资料
其他作者: Peckerar, Martin
格式: 电子 电子书
语言:英语
出版: SPIE Digital Library, 7/9/92
主题:
在线阅读:Full text available on Research4Life (SPIE Digital Library)
实物特征
Item Description:<strong>On-Campus Access Only (IP based access)</strong>
实物描述:1 online resource
格式:Mode of access: Internet
ISBN:9780819408266
访问:Electronic access restricted to authorized AUW faculty, staff and students