Cita APA

Postek, M. Integrated Circuit Metrology, Inspection, and Process Control VI. SPIE Digital Library.

Citación estilo Chicago

Postek, Michael. Integrated Circuit Metrology, Inspection, and Process Control VI. SPIE Digital Library.

Cita MLA

Postek, Michael. Integrated Circuit Metrology, Inspection, and Process Control VI. SPIE Digital Library.

Warning: These citations may not always be 100% accurate.