Postek, M. Integrated Circuit Metrology, Inspection, and Process Control VI. SPIE Digital Library.
Chicago-čujuhus (17. p.)Postek, Michael. Integrated Circuit Metrology, Inspection, and Process Control VI. SPIE Digital Library.
MLA-čujuhus (9. p.)Postek, Michael. Integrated Circuit Metrology, Inspection, and Process Control VI. SPIE Digital Library.
Muitte dárkkistit čujuhemiid riektatvuođa, ovdal go geavahat daid iežat deavsttas.