Postek, M. Integrated Circuit Metrology, Inspection, and Process Control VI. SPIE Digital Library.
芝加哥风格引文Postek, Michael. Integrated Circuit Metrology, Inspection, and Process Control VI. SPIE Digital Library.
MLA引文Postek, Michael. Integrated Circuit Metrology, Inspection, and Process Control VI. SPIE Digital Library.
警告：这些引文格式不一定是100％准确.