Postek, M. Integrated Circuit Metrology, Inspection, and Process Control VII. SPIE Digital Library.
Citación estilo ChicagoPostek, Michael. Integrated Circuit Metrology, Inspection, and Process Control VII. SPIE Digital Library.
Cita MLAPostek, Michael. Integrated Circuit Metrology, Inspection, and Process Control VII. SPIE Digital Library.
Warning: These citations may not always be 100% accurate.