Vasquez, B. Microelectronics Manufacturability, Yield, and Reliability. SPIE Digital Library.
Chicago-viite (17. p.)Vasquez, Barbara. Microelectronics Manufacturability, Yield, and Reliability. SPIE Digital Library.
MLA-viite (9. p.)Vasquez, Barbara. Microelectronics Manufacturability, Yield, and Reliability. SPIE Digital Library.
Varoitus: Nämä viitteet eivät aina ole täysin luotettavia.