Vasquez, B. Microelectronics Manufacturability, Yield, and Reliability. SPIE Digital Library.
Citación estilo ChicagoVasquez, Barbara. Microelectronics Manufacturability, Yield, and Reliability. SPIE Digital Library.
Cita MLAVasquez, Barbara. Microelectronics Manufacturability, Yield, and Reliability. SPIE Digital Library.
Warning: These citations may not always be 100% accurate.