Vasquez, B. Microelectronics Manufacturability, Yield, and Reliability. SPIE Digital Library.
Chicago Style (17th ed.) CitationVasquez, Barbara. Microelectronics Manufacturability, Yield, and Reliability. SPIE Digital Library.
MLA引文Vasquez, Barbara. Microelectronics Manufacturability, Yield, and Reliability. SPIE Digital Library.
警告:這些引文格式不一定是100%准確.