APA (7th ed.) Zitazioa

Hoy Bennett, M. Integrated Circuit Metrology, Inspection, and Process Control IX. SPIE Digital Library.

Chicago Style (17th ed.) Zitazioa

Hoy Bennett, Marylyn. Integrated Circuit Metrology, Inspection, and Process Control IX. SPIE Digital Library.

MLA (9th ed.) Zitazioa

Hoy Bennett, Marylyn. Integrated Circuit Metrology, Inspection, and Process Control IX. SPIE Digital Library.

Kontuz: berrikusi erreferentzia hauek erabili aurretik.