Cita APA

Hoy Bennett, M. Integrated Circuit Metrology, Inspection, and Process Control IX. SPIE Digital Library.

Citación estilo Chicago

Hoy Bennett, Marylyn. Integrated Circuit Metrology, Inspection, and Process Control IX. SPIE Digital Library.

Cita MLA

Hoy Bennett, Marylyn. Integrated Circuit Metrology, Inspection, and Process Control IX. SPIE Digital Library.

Warning: These citations may not always be 100% accurate.