Hoy Bennett, M. Integrated Circuit Metrology, Inspection, and Process Control IX. SPIE Digital Library.
Citazione stile Chigago Style (17a edizione)Hoy Bennett, Marylyn. Integrated Circuit Metrology, Inspection, and Process Control IX. SPIE Digital Library.
Citatione MLA (9a ed.)Hoy Bennett, Marylyn. Integrated Circuit Metrology, Inspection, and Process Control IX. SPIE Digital Library.
Attenzione: Queste citazioni potrebbero non essere precise al 100%.