Integrated Circuit Metrology, Inspection, and Process Control IX

Xehetasun bibliografikoak
Beste egile batzuk: Hoy Bennett, Marylyn
Formatua: Baliabide elektronikoa eBook
Hizkuntza:ingelesa
Argitaratua: SPIE Digital Library, 5/22/95
Gaiak:
Sarrera elektronikoa:Full text available on Research4Life (SPIE Digital Library)
Deskribapena
Alearen deskribapena:<strong>On-Campus Access Only (IP based access)</strong>
Deskribapen fisikoa:1 online resource
Formatua:Mode of access: Internet
ISBN:9780819417879
Sartu:Electronic access restricted to authorized AUW faculty, staff and students