Dyfyniad APA

Rao, G. Microelectronic Manufacturing Yield, Reliability, and Failure Analysis. SPIE Digital Library.

Dyfyniad Arddull Chicago

Rao, Gopal. Microelectronic Manufacturing Yield, Reliability, and Failure Analysis. SPIE Digital Library.

Dyfyniad MLA

Rao, Gopal. Microelectronic Manufacturing Yield, Reliability, and Failure Analysis. SPIE Digital Library.

Rhybudd: Mae'n bosib nad yw'r dyfyniadau hyn bob amser yn 100% cywir.