Cita APA

Rao, G. Microelectronic Manufacturing Yield, Reliability, and Failure Analysis. SPIE Digital Library.

Citación estilo Chicago

Rao, Gopal. Microelectronic Manufacturing Yield, Reliability, and Failure Analysis. SPIE Digital Library.

Cita MLA

Rao, Gopal. Microelectronic Manufacturing Yield, Reliability, and Failure Analysis. SPIE Digital Library.

Warning: These citations may not always be 100% accurate.