APA (7. basım) Alıntı

Rao, G. Microelectronic Manufacturing Yield, Reliability, and Failure Analysis. SPIE Digital Library.

Chicago Style (17. basım) Atıf

Rao, Gopal. Microelectronic Manufacturing Yield, Reliability, and Failure Analysis. SPIE Digital Library.

MLA (9th ed.) Atıf

Rao, Gopal. Microelectronic Manufacturing Yield, Reliability, and Failure Analysis. SPIE Digital Library.

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