Microelectronic Manufacturing Yield, Reliability, and Failure Analysis
| Другие авторы: | |
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| Формат: | Электронный ресурс eКнига |
| Язык: | английский |
| Опубликовано: |
SPIE Digital Library,
9/22/95
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| Предметы: | |
| Online-ссылка: | Full text available on Research4Life (SPIE Digital Library) |
| Примечание: | <strong>On-Campus Access Only (IP based access)</strong> |
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| Объем: | 1 online resource |
| Формат: | Mode of access: Internet |
| ISBN: | 9780819420015 |
| Доступ: | Electronic access restricted to authorized AUW faculty, staff and students |