Lowell, J. Optical Characterization Techniques for High-Performance Microelectronic Device Manufacturing II. SPIE Digital Library.
Citazione stile Chigago Style (17a edizione)Lowell, John. Optical Characterization Techniques for High-Performance Microelectronic Device Manufacturing II. SPIE Digital Library.
Citatione MLA (9a ed.)Lowell, John. Optical Characterization Techniques for High-Performance Microelectronic Device Manufacturing II. SPIE Digital Library.
Attenzione: Queste citazioni potrebbero non essere precise al 100%.