Lowell, J. Optical Characterization Techniques for High-Performance Microelectronic Device Manufacturing II. SPIE Digital Library.
Tohutoru Kātū Chicago (17th ed.)Lowell, John. Optical Characterization Techniques for High-Performance Microelectronic Device Manufacturing II. SPIE Digital Library.
Tohutoro MLA (9th ed.)Lowell, John. Optical Characterization Techniques for High-Performance Microelectronic Device Manufacturing II. SPIE Digital Library.
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