Cita APA

Jones, S. Metrology, Inspection, and Process Control for Microlithography X. SPIE Digital Library.

Citación estilo Chicago

Jones, Susan. Metrology, Inspection, and Process Control for Microlithography X. SPIE Digital Library.

Cita MLA

Jones, Susan. Metrology, Inspection, and Process Control for Microlithography X. SPIE Digital Library.

Warning: These citations may not always be 100% accurate.