8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Subnanometer Accuracy Measurement for Synchrotron Optics and X-Ray Optics
| Weitere Verfasser: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | Englisch |
| Veröffentlicht: |
SPIE Digital Library,
1/1/16
|
| Schlagworte: | |
| Online-Zugang: | Full text available on Research4Life (SPIE Digital Library) |
| Beschreibung: | <strong>On-Campus Access Only (IP based access)</strong> |
|---|---|
| Beschreibung: | 1 online resource |
| Format: | Mode of access: Internet |
| ISBN: | 9781628419221 |
| Zugangseinschränkungen: | Electronic access restricted to authorized AUW faculty, staff and students |