8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Subnanometer Accuracy Measurement for Synchrotron Optics and X-Ray Optics
| Muut tekijät: | |
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| Aineistotyyppi: | Elektroninen E-kirja |
| Kieli: | englanti |
| Julkaistu: |
SPIE Digital Library,
1/1/16
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| Aiheet: | |
| Linkit: | Full text available on Research4Life (SPIE Digital Library) |
| Huomautukset: | <strong>On-Campus Access Only (IP based access)</strong> |
|---|---|
| Ulkoasu: | 1 online resource |
| Aineistotyyppi: | Mode of access: Internet |
| ISBN: | 9781628419221 |
| Pääsy: | Electronic access restricted to authorized AUW faculty, staff and students |