8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Subnanometer Accuracy Measurement for Synchrotron Optics and X-Ray Optics
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| Natura: | Elettronico eBook |
| Lingua: | inglese |
| Pubblicazione: |
SPIE Digital Library,
1/1/16
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| Accesso online: | Full text available on Research4Life (SPIE Digital Library) |
| Descrizione del documento: | <strong>On-Campus Access Only (IP based access)</strong> |
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| Descrizione fisica: | 1 online resource |
| Natura: | Mode of access: Internet |
| ISBN: | 9781628419221 |
| Accesso: | Electronic access restricted to authorized AUW faculty, staff and students |