8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Subnanometer Accuracy Measurement for Synchrotron Optics and X-Ray Optics

Bibliografiske detaljer
Andre forfattere: Qian, Shinan
Format: Electronisk eBog
Sprog:engelsk
Udgivet: SPIE Digital Library, 1/1/16
Fag:
Online adgang:Full text available on Research4Life (SPIE Digital Library)

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