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Automated Visual Inspection and Machine Vision

Bibliografske podrobnosti
Drugi avtorji:	Beyerer, JÃ¼rgen
Format:	Elektronski eKnjiga
Jezik:	angleščina
Izdano:	SPIE Digital Library, 5/19/15
Teme:	Conference papers and proceedings.
Online dostop:	Full text available on Research4Life (SPIE Digital Library)

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