Yue, Y. Second International Conference on Testing Technology and Automation Engineering (TTAE 2022). SPIE Digital Library.
Chicago Style (17th ed.) CitationYue, Yang. Second International Conference on Testing Technology and Automation Engineering (TTAE 2022). SPIE Digital Library.
MLA引文Yue, Yang. Second International Conference on Testing Technology and Automation Engineering (TTAE 2022). SPIE Digital Library.
警告:這些引文格式不一定是100%准確.