Yue, Y. Second International Conference on Testing Technology and Automation Engineering (TTAE 2022). SPIE Digital Library.
Cita Chicago Style (17a ed.)Yue, Yang. Second International Conference on Testing Technology and Automation Engineering (TTAE 2022). SPIE Digital Library.
Cita MLA (9a ed.)Yue, Yang. Second International Conference on Testing Technology and Automation Engineering (TTAE 2022). SPIE Digital Library.
Precaución: Estas citas no son 100% exactas.