Automated Visual Inspection and Machine Vision V

Détails bibliographiques
Autres auteurs: Beyerer, Jürgen, Fraunhofer-Institut für Optronik, Systemtechnik und Bildauswertung IOSB
Format: Électronique eBook
Langue:anglais
Publié: SPIE Digital Library, 1/1/69
Sujets:
Accès en ligne:Full text available on Research4Life (SPIE Digital Library)
Description
Description:<strong>On-Campus Access Only (IP based access)</strong>
Description matérielle:1 online resource
Format:Mode of access: Internet
ISBN:9781510664555
9781510664562
Accès:Electronic access restricted to authorized AUW faculty, staff and students