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Automated Visual Inspection and Machine Vision V

Dades bibliogràfiques
Altres autors:	Beyerer, JÃ¼rgen, Fraunhofer-Institut fÃ¼r Optronik, Systemtechnik und Bildauswertung IOSB
Format:	Electrònic eBook
Idioma:	anglès
Publicat:	SPIE Digital Library, 1/1/69
Matèries:	Conference papers and proceedings.
Accés en línia:	Full text available on Research4Life (SPIE Digital Library)

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