Buchumschlag

Automated Visual Inspection and Machine Vision V

Bibliographische Detailangaben
Weitere Verfasser:	Beyerer, JÃ¼rgen, Fraunhofer-Institut fÃ¼r Optronik, Systemtechnik und Bildauswertung IOSB
Format:	Elektronisch E-Book
Sprache:	Englisch
Veröffentlicht:	SPIE Digital Library, 1/1/69
Schlagworte:	Conference papers and proceedings.
Online-Zugang:	Full text available on Research4Life (SPIE Digital Library)

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