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Automated Visual Inspection and Machine Vision V

Detalles Bibliográficos
Outros autores:	Beyerer, JÃ¼rgen, Fraunhofer-Institut fÃ¼r Optronik, Systemtechnik und Bildauswertung IOSB
Formato:	Electrónico eBook
Idioma:	inglés
Publicado:	SPIE Digital Library, 1/1/69
Subjects:	Conference papers and proceedings.
Acceso en liña:	Full text available on Research4Life (SPIE Digital Library)

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