Optical Metrology and Inspection for Industrial Applications X

Bibliografiske detaljer
Andre forfattere: Han, Sen
Format: Electronisk eBog
Sprog:engelsk
Udgivet: SPIE Digital Library, 1/1/82
Fag:
Online adgang:Full text available on Research4Life (SPIE Digital Library)
Beskrivelse
Emne beskrivelse:<strong>On-Campus Access Only (IP based access)</strong>
Fysisk beskrivelse:1 online resource
Format:Mode of access: Internet
ISBN:9781510667877
9781510667884
Adgang:Electronic access restricted to authorized AUW faculty, staff and students