Optical Metrology and Inspection for Industrial Applications X

Bibliografski detalji
Daljnji autori: Han, Sen
Format: Elektronički e-knjiga
Jezik:engleski
Izdano: SPIE Digital Library, 1/1/82
Teme:
Online pristup:Full text available on Research4Life (SPIE Digital Library)
Opis
Opis predmeta:<strong>On-Campus Access Only (IP based access)</strong>
Opis fizičkog objekta:1 online resource
Format:Mode of access: Internet
ISBN:9781510667877
9781510667884
Pristup:Electronic access restricted to authorized AUW faculty, staff and students