APA-referens (7:e uppl.)

Postek, M. Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors VIII. SPIE Digital Library.

Chicago-referens (17:e uppl.)

Postek, Michael. Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors VIII. SPIE Digital Library.

MLA-referens (9:e uppl.)

Postek, Michael. Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors VIII. SPIE Digital Library.

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