APA ציטוט

Postek, M. Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors VIII. SPIE Digital Library.

Chicago Style (17th ed.) Citation

Postek, Michael. Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors VIII. SPIE Digital Library.

ציטוט MLA

Postek, Michael. Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors VIII. SPIE Digital Library.