APA (7. basım) Alıntı

Postek, M. Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors VIII. SPIE Digital Library.

Chicago Style (17. basım) Atıf

Postek, Michael. Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors VIII. SPIE Digital Library.

MLA (9th ed.) Atıf

Postek, Michael. Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors VIII. SPIE Digital Library.

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