APA引文

Postek, M. Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors VIII. SPIE Digital Library.

Chicago Style (17th ed.) Citation

Postek, Michael. Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors VIII. SPIE Digital Library.

MLA引文

Postek, Michael. Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors VIII. SPIE Digital Library.

警告：這些引文格式不一定是100％准確.